Surface-extended X-ray absorption fine structure
（重定向自SEXAFS）
Surface-extended X-ray absorption fine structure (SEXAFS) is the surface-sensitive equivalent of the EXAFS technique. This technique involves the illumination of the sample by high-intensity X-ray beams from a synchrotron and monitoring their photoabsorption by detecting in the intensity of Auger electrons as a function of the incident photon energy. Surface sensitivity is achieved by the interpretation of data depending on the intensity of the Auger electrons (which have an escape depth of ~1–2 nm) instead of looking at the relative absorption of the X-rays as in the parent method, EXAFS.