| 释义 |
testing digital logic circuits
- 逻辑电路luó jí diàn lù
logic circuit
- 手指的shǒu zhǐ de
digital
- 数字式shù zì shì
digital
- 逻辑luó jí
logic
- 论理lùn lǐ
logic, normally
- 事理shì lǐ
logic, reason
- 集成注入逻辑jí chéng zhù rù luó jí
integrated injection logic
- 冗余测试rǒng yú cè shì
redundancy testing
- 形式逻辑xíng shì luó jí
formal logic
- 阵列逻辑zhèn liè luó jí
array logic
- 涡流检测wō liú jiǎn cè
eddy current testing
- 扫描电路sǎo miáo diàn lù
sweep circuit; scanning circuit
- 读写能力测验dú xiě néng lì cè yàn
alpha testing
- 印制电路yìn zhì diàn lù
printed circuit; printed wiring; plated circuit
- 周游zhōu yóu
circuit, circumgyrate, circumgyration, tour
- 数位的shù wèi de
digital
- 厚膜电路hòu mó diàn lù
thick film circuit
- 前馈电路qián kuì diàn lù
feed forward circuit
- 试验的shì yàn de
testing
- 闭路bì lù
mesh; closed circuit; closed-loop circuit; closing
- 门电路mén diàn lù
gate circuit; gating circuit; gate
- 甚高性能集成电路shèn gāo xìng néng jí chéng diàn lù
vhpic; very high performance integrated circuit
- 数字线shù zì xiàn
digital line
- 短路duǎn lù
short circuit; cutting-out; short out; short pass
- 级联整流电路jí lián zhěng liú diàn lù
cascade rectifier circuit
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