Field ion microscope
（重定向自Field ion microscopy）
![Field ion microscope image of the end of a sharp platinum needle. Each bright spot is a platinum atom.](/Images/godic/202501/13/FIM-platinum3613.jpg")
![FIM experimental set-up.](/Images/godic/202501/13/FIM_experimental_set_up3613.jpg")
![FIM image formation process.](/Images/godic/202501/13/FIMtip3614.JPG")
Field ion microscopy (FIM) is an analytical technique used in materials science. The field ion microscope is a type of microscope that can be used to image the arrangement of atoms at the surface of a sharp metal tip. It was the first technique by which individual atoms could be spatially resolved.